| 数字集成电路参数测试仪的设计 |
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| 引用本文： | 谢一菁.数字集成电路参数测试仪的设计[J].闽西职业技术学院学报,2007,9(2):63-65. |
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| 作者姓名： | 谢一菁 |
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| 作者单位： | 漳州职业技术学院,电子工程系,福建,漳州,363000 |
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| 摘 要： | 以AT89C51单片机为核心设计了一种简易数字集成电路参数的测试仪器。测试仪采用多值参数比较法,利用单片机的数学运算和控制功能,对数字IC进行功能测试,同时完成各项直流参数测试,并通过8279键盘控制来实现测量中的量程自动切换及各路测试项目的参数显示。
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| 关 键 词： | 单片机 集成电路 数模转换 键盘控制 |
| 文章编号： | 1673-4823（2007）02-0063-03 |
| 修稿时间： | 2007-01-08 |
Design of the numerical integrated circuit parameter test instrument |
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| XIE Yi-jing.Design of the numerical integrated circuit parameter test instrument[J].Journal of Minxi Vocational and Technival College,2007,9(2):63-65. |
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| Authors: | XIE Yi-jing |
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| Institution: | Department of Electronic Engineering,Zhangzhou Institute of Technology,Zhangzhou, Fujian, 363000,China |
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| Abstract: | With the AT89 C51 single slice machine as the core,a kind of test instrument of simple and numerical integrated circuit parameter is designed.This test instrument adopts multi-value parameter comparison method and carries on the functional test on IC,making use of the mathematics operation and controling function of a slice machine.In the meantime,it completes various direct current parameter tests and through the 8279 keyboards control realizes the automatic cutting of quantity distance in the diagraph and the parameter manifestation of each tested item. |
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| Keywords: | single slice machine integrated circuit digital molds convert keyboard control |
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