| 高、低考试焦虑者的工作记忆刷新功能:任务负荷与刺激材料的影响 |
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| 引用本文： | 郭伟,邹吉林,高鑫,周仁来.高、低考试焦虑者的工作记忆刷新功能:任务负荷与刺激材料的影响[J].中国特殊教育,2012(7):74-79. |
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| 作者姓名： | 郭伟 邹吉林 高鑫 周仁来 |
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| 作者单位： | 1. 东南大学儿童发展和学习科学教育部重点实验室,南京,210096
2. 东南大学儿童发展和学习科学教育部重点实验室,南京,210096;北京师范大学认知神经科学与学习国家重点实验室,北京,100875;北京师范大学应用实验心理北京市重点实验室,北京,100875 |
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| 基金项目： | 东南大学儿童发展与学习科学教育部重点实验室开放研究基金资助课题 |
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| 摘 要： | 以考试相关和中性图片为刺激材料,采用n-back实验范式,考察高、低任务负荷条件下,高、低考试焦虑者的工作记忆刷新表现。结果表明:高、低负荷任务中,高考试焦虑者对考试相关图片的反应时都显著长于低焦虑者;高负荷任务中,高考试焦虑者对考试相关图片的反应正确率显著低于低考试焦虑者,而在低负荷任务中无差异。对中性图片的反应时及正确率两组均无差异。研究认为,高负荷条件下,高考试焦虑者对考试相关图片的工作记忆刷新功能较低考试焦虑者有显著缺陷。
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| 关 键 词： | 考试焦虑 工作记忆 刷新 n-back 负荷 |
The Working Memory Updating of High and Low Test-Anxious Students: the Effect of the Task Load and Stimuli |
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| GUO Wei
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ZOU Jilin
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GAO Xin
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ZHOU Renlai.The Working Memory Updating of High and Low Test-Anxious Students: the Effect of the Task Load and Stimuli[J].Chinese Journal of Special Education,2012(7):74-79. |
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| Authors: | GUO Wei ZOU Jilin GAO Xin ZHOU Renlai |
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| Institution: | 1,2,3(1.Ministry of Education Key Laboratory of Child Development and Learning Science,Southeast University,Nanjing,210096;2.State Key Laboratory of Cognitive Neuroscience and Learning,Beijing Normal University,Beijing,100875;3.Beijing Key Laboratory of Applied Experimental Psychology,Beijing Normal University,Beijing,100875) |
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| Abstract: | The present study,by using test-related and neutral pictures as stimuli in the n-back paradigm,aims to explore the working memory updating of high and low test-anxious students under high and low task loads.The results show the following:(1) in the high-and low-load task,the high test-anxious students’ time of reaction to test-related pictures is significantly longer than the low test-anxious students’;(2) in the high-load task,the high test-anxious students show a significantly lower rate of correct reaction to test-related pictures than the low test-anxious students,but they show no difference in the low-load task;the two groups show no difference in the time of reaction to neutral pictures and the rate of correct reaction.The authors believe that under the high-load task,the high test-anxious students,compared with the low test-anxious students,show significant defects in the working memory updating of test-related pictures. |
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| Keywords: | test anxiety working memory updating n-back load |
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