| Institution: | 1. Faculty of Science, Beijing University of Technology,Beijing 100124, China;2. Faculty of Information Technology, Beijing University of Technology, Beijing 100124, China;3. School of Computer Science, Beijing Information Science and Technology University, Beijing 100101, China;1. School of Mathematics and Statistics, Shandong University of Technology, Zibo 255000, China;2. College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, 266590, China;1. College of Electrical Engineering, North China University of Science and Technology, Tangshan, China;2. Institute of Electrical Engineering, Yanshan University, Qinhuangdao, China;3. Department of Electrical Engineering, Yeungnam University, Kyongsan, Republic of Korea;1. Tecnológico Nacional de México, Instituto Tecnológico de Durango, C.P. 34080;2. Universidad Autónoma de Nuevo Léon, FCFM, San Nicolas de los Garza, CP NL 66455, México;1. Department of Electronics and Communications Engineering, De La Salle University, 2401 Taft Ave., Manila, 0922, Philippines;2. Electronics Engineering Department, University of Santo Tomas, Espana Blvd., Sampaloc, Manila,1008, Philippines;3. Tokyo City University, 1-28-1 Tamazutsumi, Setagaya, Tokyo, 158-8557, Japan;1. College of Automation, Chongqing University, Chongqing, 400044, China;2. College of Information Science and Engineering, Northeastern University, Shenyang, Liaoning, 110004, China;1. Department of Automation, University of Science and Technology of China, Hefei 230027, China;2. Quantum Machines Unit, Okinawa Institute of Science and Technology Graduate University, Okinawa 904-0495, Japan;3. School of Automation, Hangzhou Dianzi University, Hangzhou 310018, China |
