利用光学外差技术同时测定透明板的折射率和厚度

通过分析圆偏振外差光束分别经透明板反射和透射后的s光和p光的相位差改变,得到了它们与透明板折射率和厚度的关系.利用改进的M-Z干涉仪设计和构建了能同时测定透明板的折射率和厚度的实验装置,通过测量从透明板反射的圆偏振外差光束的s光和p光的相位差,将测量数据代入理论上导出的特定方程,可以计算出被测透明板的折射率.同时,透明板又在改进的M-Z干涉仪的测量臂中,由波长偏移和光通过透明板引起s光和p光的相位差改变.由透明板折射率的测量值、相位差改变和波长偏移的特定值可得到透明板的厚度.从而实现在同一光学构造下完成对透明板的折射率和厚度的同时测量.

Measuring Refractive Index and Thickness Simultaneously of a Transparent Plate with the Heterodyne Technique

The phase difference between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from a transparent plate is measured. The measured data is substituted into the specially derived equations and the refractive index can be calculated. Next, the variations of phase difference between s- and p-polarizations due to the wavelength shift and the extraction of the plate in a modified Mach-Zehnder interferometer are measured. Then, its thickness can be calculated based on the measured value of refractive index, the variations of phase difference, and the specified value of wavelength shift. Thus, refractive index and thickness of a transparent plate can be measured simultaneously with the same technique.