High accuracy zoom magnification measurement |
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Authors: | ZENG Zhengdong SUN Changku ZHENG Yizhong YAN Mingdong CHANG Sengkeong |
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Affiliation: | 1. School of Precision Instruments and Opto-Electronics Engineering,Tianjin University,Tianjin 300072,China 2. Leica Instruments Singapore Pte Ltd,12 Teban Gardens Crescent Singapore,608924 |
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Abstract: | A precise zoom magnification is important for semiconductor industry and biomedical research. A novel measurement method is demonstrated for optical zoom magnification measurement in this paper. The magnification is obtained by pattern correction between barcode image formed by optical zoom and reference image generated by an ideal optical model. Measurement accuracy which is better than 0.06% has been achieved for optical zoom magnification. Compared with traditional concept, the measurement results are only dependent on two line edges. The barcode correlation method can achieve higher accuracy and better robustness by using the information over the whole field of view. |
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Keywords: | magnification microscope optical zoom barcode image processing measurement apparatus |
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