Bibliographically coupled patents: Their temporal pattern and combined relevance |
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| Authors: | Chung-Huei Kuan Dar-Zen Chen Mu-Hsuan Huang |
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| Affiliation: | 1. National Taiwan University of Science and Technology, Graduate Institute of Patent, No. 43, Sec. 4, Keelung Rd., Taipei, Taiwan, ROC;2. National Taiwan University, Department of Mechanical Engineering, No. 1, Sec. 4, Roosevelt Rd., Taipei, Taiwan, ROC;3. National Taiwan University, Department of Library and Information Science, No. 1, Sec. 4, Roosevelt Rd., Taipei, Taiwan, ROC;4. National Taiwan University, Center for Research in Econometric Theory and Applications (CRETA), No. 1, Sec. 4, Roosevelt Rd., Taipei, Taiwan, ROC |
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| Abstract: | Bibliographically coupled patents reveal a temporal pattern associated with their ages (how long ago they have been issued) and spans (their distance in time). The coupling strength of the aged or long-spanned patent pairs may be inherently limited, especially for fields that reveal patent and reference expansions. This study proposes a simple measure, combined relevance (CR), to counter such impact. Unlike traditional measures, CR provides more balanced treatment to short- and long-spanned but favors more aged patents pairs. A fixed CR threshold may be more safely applied with a reduced possibility of erroneously removing patent pairs that are truly related. For observing long-term knowledge dissemination or tracing overall development trajectory, CR may be an alternative. |
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| Keywords: | Corresponding author at: National Taiwan University, Department of Mechanical Engineering, No. 1, Sec. 4, Roosevelt Rd., Taipei, Taiwan, ROC. Bibliography coupling Temporal pattern Patent expansion Reference expansion Combined relevance |
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