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Run-to-run product quality control of batch processes
Authors:Li Jia  Ji-ping Shi  Da-shuai Cheng  Min-sen Chiu
Institution:1. Shanghai Key Laboratory of Power Station Automation Technology,School of Mechatronics Engineering and Automation,Shanghai University,Shanghai 200072,P.R.China
2. Faculty of Engineering,National University of Singapore,Singapore
Abstract:Batch processes have been increasingly used in the production of low volume and high value added products. Consequently, optimization control in batch processes is crucial in order to derive the maximum benefit. In this paper, a run-to-run product quality control based on iterative learning optimization control is developed. Moreover, a rigorous theorem is proposed and proven in this paper, which states that the tracking error under the optimal iterative learning control (ILC) law can converge to zero. In this paper, a typical nonlinear batch continuous stirred tank reactor (CSTR) is considered, and the results show that the performance of trajectory tracking is gradually improved by the ILC. Project supported by the Science Foundation of Shanghai Municipal Education Commission (Grant No.09Y208), and the Science Foundation of Science and Technology Commission of Shanghai Municipality (Grant Nos.08DZ2272400, 09DZ2273400) and the “11th Five-Year Plan” 211 Construction Project of Shanghai University
Keywords:iterative learning optimization control  tracking error  batch processes
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