基于改进遗传算法的组合电路测试生成

测试生成是集成电路测试研究的一个热点问题。针对遗传算法存在的搜索空间大、时间长的不足,在分析了逻辑门的关键位和非关键位的基础上,提出一种电路分块方法,使得遗传算法在测试生成中的应用得到了优化。仿真结果显示,该方法可获得100%的故障覆盖率,且测试时间缩短了15%。证实了该方法的有效性和可行性。

Study on Test Generation of Combinational Circuits Based on Improved Genetic Algorithm

Test generation of ICs test has become a hot issue.The genetic algorithm,which has been applied for test generation,has many disadvantages,such as long search time and expensive search space.Based on the analysis of the logic gate critical and non-critical position,a circuit partitioning method was proposed.By the proposed method,the genetic algorithm for the test generation was optimized.The simulation results show that the method will obtain 100% fault coverage ratio while the test time is shortened by 15%,which demonstrate the feasibility and effectiveness of the method.