| 用光切法测量表面粗糙度Rz、S值的实验研究 |
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| 引用本文： | 杨晓红. 用光切法测量表面粗糙度Rz、S值的实验研究[J]. 实验室研究与探索, 2000, 19(5): 50-53 |
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| 作者姓名： | 杨晓红 |
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| 作者单位： | 盐城工学院 机械工程系，江苏 盐城 224003 |
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| 摘 要： | 用光切法测量表面粗糙度RZ、S值可实现对表面轮廓要求的二维控制。介绍了原理、操作、处理等方面的技术细节，对工程应用具有指导价值。
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| 关 键 词： | 光切法 RZ值 S值 单峰平均间距 峰谷 表面粗糙度测量 光切显微镜 |
| 文章编号： | 1006-7167(2000)05-0050-04 |
| 修稿时间： | 1999-11-09 |
Experimental Research On Surface Roughness Of Rz and S by Using Light-Section Method |
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| YANG Xiao-hong. Experimental Research On Surface Roughness Of Rz and S by Using Light-Section Method[J]. Laboratory Research and Exploration, 2000, 19(5): 50-53 |
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| Authors: | YANG Xiao-hong |
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| Abstract: | The measurements of surface roughness of Rz and S by using light-section methodmay realize two dimensional control of surface profile. This article introduced technical de-tails of the theories, operations and treatment etc. These were also useful to the engineeringapplication. |
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| Keywords: | light-section method ten point height of irregularities(Rz) mean spacing of lo-cal peaks(S) peak and valley |
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