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单片机在非稳态法测定不良导体热导热系数中的应用
引用本文:李志强,游开明. 单片机在非稳态法测定不良导体热导热系数中的应用[J]. 衡阳师范学院学报, 2004, 25(6): 34-36
作者姓名:李志强  游开明
作者单位:衡阳师范学院,物理与电子信息科学系,湖南,衡阳,421008
基金项目:衡阳师范学院资助项目(衡师科发[2003]14号)
摘    要:介绍了在非稳态法测定不良导体导热系统中,使用单片机进行数据采集、解偏微分方程等复杂数据的处理、测试条件的自动控制,导热系数的自动求取,能直接显示待测材料的导热系数。

关 键 词:单片机  不良导体  非稳态  导热系数
文章编号:1673-0313(2004)06-0034-03
修稿时间:2003-12-27

The Application of the Microcontroller Unit in Transient Measuring Thermal Conductivity Measurer of Poor Conductor
LI Zhi-qiang,YOU Kai-ming. The Application of the Microcontroller Unit in Transient Measuring Thermal Conductivity Measurer of Poor Conductor[J]. journal of Hengyang Normal University, 2004, 25(6): 34-36
Authors:LI Zhi-qiang  YOU Kai-ming
Abstract:The article introduces the method of transient measuring the thermal conductivity by Microcontroller Unit. The thermal conductivity measurer, which can deal with some complicate data, such as partial differential equation with the help of Microcontroller Unit.It can also automatically measure the temperature of a place where the material is put, and complete the automatic control of measuring condition and get the data of thermal conductivity immediately, at the premise of making sure the precision.
Keywords:Microcontroller Unit  poor Conductor  transient  thermal conductivity
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